KeywordGrowth of oxide film,Ambient temperature,Aging Term,Activation energy,Boltzmann constant. |
Reference[1]:Japanese Industrial Standards Committee:『Environmental testing -- Part 2-82: Tests -- Test XW1: Whisker test methods for electronic and electric components』,JIS C 60068-2-82:2009 |
Remarks・Making above Equation Image is powered by CODECOGS |
History・2010/04/28:Upload. |